Digital Systems Testing And Testable Design Solution High Quality

The Last Silicon Bug

• Scan only a subset of flip-flops (cycle-breaking set).
• Use cycle cutset selection: flip-flops that break all cycles in the sequential graph.

9. Conclusion: Hallmarks of a High-Quality Solution

Digital Systems Testing and Testable Design: The Path to High-Quality Solutions

Test Generation:

Methods for creating optimal test vectors to detect faults. The Last Silicon Bug

The benefits of testable design include: Scan only a subset of flip-flops (cycle-breaking set)